Linear Integrated Systems Spotlights Industry's Only 100% Noise-Tested Ultra-Low-Noise JFETs
- JC - Linear Systems
- Dec 16
- 1 min read
Why Verified Noise Performance Still Matters in Precision Design
As precision analog systems continue to push the limits of sensitivity, stability, and signal integrity, noise performance is no longer a “nice to have” — it’s a design requirement.
At Linear Integrated Systems, ultra-low-noise JFETs have long played a critical role in applications where engineers can’t afford variability or guesswork. From medical sensing and instrumentation to radar, defense, and professional audio, designers increasingly need components with predictable, repeatable performance, not just typical or sampled specifications.
That’s why we continue to spotlight our approach to 100% noise testing across our ultra-low-noise JFET portfolio, including the LSK170 single JFET and LSK389 monolithic dual JFET. Every device is verified before shipment — helping engineers reduce design risk, shorten validation cycles, and improve long-term system stability.
In our latest press release, we share:
Why full noise verification is becoming more critical as systems grow more sensitive
How monolithic dual JFETs improve matching and thermal stability
Where ultra-low-noise JFETs are being used across today’s most demanding applications
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