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Join date: May 8, 2024
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Aug 12, 2026 ∙ 2 min
⚡ FET Design Spotlight: Electron Beam Circuit Protection with PAD Diodes
High-voltage electron beam systems demand precision—and protecting sensitive measurement circuitry is critical to maintaining accuracy and minimizing costly downtime. In this latest FET Design Spotlight, we look at how Linear Systems PAD Diodes have provided reliable circuit protection in electron beam applications for more than 35 years. Electron Beam Circuit Protection by PAD Diodes "High-voltage applications happen to be a difficult place to involve sensitive measurement and control...
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Aug 6, 2026 ∙ 2 min
Linear Systems Learning Series: How to Read a JFET Datasheet
A JFET datasheet contains dozens of electrical characteristics, graphs, and performance curves—but which specifications matter most? The answer depends on your application. A designer building a low-noise microphone preamplifier may prioritize different parameters than someone designing a current source or a high-impedance sensor interface. Understanding what each specification represents is the first step in selecting the right device. 1. Noise Voltage For precision analog front ends, this...
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Jul 28, 2026 ∙ 1 min
Linear Systems Learning Series: Understanding 1/f Noise: Why Low-Frequency Noise Matters
Not all noise is created equal. When engineers compare low-noise devices, they often focus on the 1 kHz noise specification. While that's an important benchmark, it doesn't tell the whole story. At lower frequencies, many semiconductor devices exhibit 1/f noise, also known as flicker noise. As frequency decreases, this noise increases, making it especially important in applications that measure slow-changing or very small signals. Examples include: Precision instrumentation Medical...
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